KOH Wet Etch

With Solstice® Systems

 

Typical KOH Wet Etch Performance

  • Within-wafer uniformity: ≤3%
  • Roughness: ≤10nm RMS
  • Rate: 0.3µ/min

 

KOH wet etch process micro image
Cleanly etched silicon structure following KOH wet etch on Solstice.

 

 

 

Typical KOH Wet Etch Performance

  • Within-wafer uniformity: ≤3%
  • Roughness: ≤10nm RMS
  • Rate: 0.3µ/min

 

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